| Description | DualBeamTM-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm |
|---|---|
| Manufacturer | FEI |
| Model | Nova 200 NanoLab |
| Quantity | 1 |
| Condition | Working |
| Equipment Detail |
FIB & SEM |
Main text
Attachments
- Catalog_Nova200NanoLab.pdf (188.0K) 12downloads | DATE : 2025-12-09 17:57:15
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