FIB/SEM (FEI, Nova 200 NanoLab)
| Description | DualBeamTM-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm |
|---|---|
| Manufacturer | FEI |
| Model | Nova 200 NanoLab |
| Quantity | 1 |
| Condition | Working |
| Equipment Detail |
SEM/FIB |
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FIB/SEM (FEI, Nova 200 NanoLab)
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- Catalog_Nova200NanoLab.pdf (188.0K) 0회 다운로드 | DATE : 2025-12-09 17:57:15
- 다음글 SORENSEN AMETEK, DC Power Supply, SGA60X250D-1DAAAS 25.09.16
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